-40%

Nanometrics Nanoline 50 CD Measurement System - Good Working Condition

$ 5280

Availability: 100 in stock
  • Condition: Used
  • Country/Region of Manufacture: United States
  • All returns accepted: ReturnsNotAccepted
  • Equipment/Component Type: CD Measurement System

    Description

    Nanometrics Nanoline 50 CD Measurement System - Good Working Condition.
    - Capable of Measuring up to 6" Wafers
    - 10X Eyepieces
    - 10X, 50x and 100X objectives
    - Less than 5 Seconds Scan Time
    - From 5 to 25 seconds auto- focus time
    - Nanoline Computer Controller
    - Keyboard
    - System Monitor
    - No Printer
    -No chart recorder
    -Aligned and tested
    Condition is "Used".
    Local pickup preferred, but shipping arrangements can be made for the lower 48 continental states.  Shipping expenses additional.